Abstract
To realize the application of Ni films in magnetic recording media, giant magnetoresistive sensors and microelectromechanical systems, it is necessary to control and improve the magnetic and electrical properties of the films. In this paper, Ni nanocrystalline films with different thicknesses and growth rates are prepared with or without a high magnetic field (HMF). The effects of a HMF on the growth, magnetic and electrical properties of the Ni films are studied. The results show that HMF changes the growth structure of the Ni films from disordered stacked grains to columnar growth along the direction of the HMF. The columnar growth becomes more prominent at a high growth rate and large film thickness. The HMF increases the grain size but decreases the surface roughness of the Ni films. Due to changes in the growth structure, grain size and film quality, the saturation magnetization of the Ni films increase markedly (by 89%), and the resistivity and coercivity significantly decrease (by 89 and 58%, respectively) by the HMF. The remanence ratio of the Ni films is controlled by the HMF. This study shows that a HMF effectively controls the growth and improves the magnetic and electrical properties of Ni films.
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