Abstract
Nanocrystalline of titanium dioxide nano films were deposited by spin coating method on silicon and ITO-glass substrates at 2000 rpm, in which starting material of Titanium Isopropoxide (C12H28O4Ti).X-ray diffraction (XRD) patterns confirmed thatpolycrystalline TiO2 anatase phase formation. The intensity of XRD peaks increases with the increase in heat treatment and better crystallinity takes place at higher temperature. The morphology of deposited films were characterized by atomic force microscope (AFM); with increasing heat treatment, both the particle size and surface roughness increased .The particle size value were 2.184,2.374,4.834,5.125, and 8.336 nm and RMS roughness values were 0.161, 0.223,0.552,0.810 and 1.494 nm for films deposited at 250, 350, 450, 550 and 650 o C respectively. Optical properties measurements (Transmittance ,T , and Absorptance , A ,) of (TiO2) films showed high transparency. It is observed that maximum transmittance at 250 o C for wavelength range 320-900 nm. The optical band gap of the films has been found to be in the range 3.28-3.62 eV for the forbidden direct electronic transition and 3.45-3.75 eV for the allowed direct transition for the different heat treatment. Keywords - Nanoanatase TiO2, Sol-Gel, XRD,AFM,Transmittance, Absorptance
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