Abstract
Heteroepitaxial Fe films on GaN(0001) are grown at 50, 350 and 500°C by molecular beam epitaxy. The structural properties of these films are studied in situ by reflection high-energy electron diffraction ϕ scans and ex situ by electron backscatter diffraction and longitudinal as well as azimuthal X-ray scans. Their morphological and magnetic properties are investigated by atomic force microscopy and superconducting quantum interference device magnetometry, respectively. Higher growth temperatures lead to a clear improvement of the structural quality of the films while retaining their morphological integrity. Furthermore, the coercivity of the films increases significantly with growth temperature.
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