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https://doi.org/10.1007/s11167-005-0442-5
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Cite Journal: Russian Journal of Applied Chemistry |  Publication Date: Jun 1, 2005 |
 Citations: 2 |
Toluene solutions of fullerene C60 with concentrations of 0.001, 0.01, and 0.2 wt % were studied by small-angle X-ray diffraction analysis. The radii of gyration of scattering elements were determined from the small-angle diffraction patterns plotted in the Guinier coordinates.
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