Abstract
The evaporation behavior of zinc tin phosphide (ZTP) alloys and its effect on the composition, structure, and photoconductive properties of the deposited films were investigated. ZTP alloys were prepared, and they were found to be of ZnSn-phosphide composition and chalcopyrite structure as obtained by thermogravimetric and x-ray diffraction analysis. The evaporation of the alloys produced random and inhomogeneous deposition with unevaporated residues due to the large difference in vapor pressure, particularly, between Zn and Sn. A closed spaced vapor deposition type setup favored uniform deposition of the films, however, with a dramatic deviation of composition and structure from that of the alloys. Rutherford backscattering, x-ray photoelectron, and energy dispersive spectroscopic studies revealed that the composition of the films is close to ZnP2 stoichiometry with less than 2% of Sn content. Raman spectroscopy and transmission electron microscopy studies showed that the films are of polycrystalline tetragonal ZnP2 structure and evolve to monocrystalline on electron irradiation. The films exhibited a broad band photoresponse in the visible wavelength region with high responsivity to the red light. The study establishes the effect of evaporation behavior of materials with large difference in vapor pressure on the properties and activity of the deposited films thereof.
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