Abstract
Electrical current pulse (ECP)treatment is an advanced technology in material processing fields. The 70% rolling reduction cold-worked grain-oriented Fe-3%Si steel was selected as the experimental materials in this study. Electrical current pulse and furnace annealing were applied on the samples respectively. Microstructure of the treated samples were investigated by EBSD analysis. Based on the experimental results and comparison with the different treated samples, the effects of ECP on grain boundary evolution of grain-oriented silicon steel were studied during primary recrystallization annealing. The proportion of low angle grain boundary (2–15°) in specimens treated by ECP is reduced while the high energy grain boundary(>15°) is increased. And the proportion of high energy grain boundary is more than low angle grain boundary. Since the marked coincident site lattice (CSL) grain boundary is few around the Goss grains, the low sigma value CSL grain boundary can’t promote the development of Goss grains during primary recrystallization.
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