Abstract
The anti-reflective SiO2 film on glass was prepared by sol-gel process and dip-coating method.The effect of drawing speed on properties of the SiO2 film was studied. The transmittance was tested by light spectrum transmittance testing system,the thickness and refractive index of SiO2 film was tested by spectroscopic ellipsometer. With increasing of the drawing speed from 100mm/min to 300 mm/min, the average of transmittance increment at first increased and then decreased, which reached the maximum 4.24% at the speed 150mm/min. The relations among transmittance, thickness (d) and refractive index (n) of the SiO2 film was dicussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.