Abstract
Zinc chloride doped l-alanine p-toluene sulfonate (LAPTZn) was grown by slow evaporation technique. Single crystal X-ray diffraction (SXRD) analysis and powder X-ray diffraction (PXRD) analysis divulges the structural description of LAPTZn crystal. The optical property have been analyzed by UV–Vis spectral analysis and photoluminescence study. The active functional groups present in the LAPTZn single crystal was determined using FTIR and FT-RAMAN analysis. The hardness and thermal stability were analyzed. The chemical composition of LAPTZn single crystal was confirmed using EDAX analysis. Dielectric analysis was also carried out. The third order NLO behavior of the LAPTZn crystal was discussed in Z-scan technique.
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