Abstract
Abstract Aluminum 6201 alloys (AA 6201) exhibit high electrical conductivity and are lightweight, thus suitable for substituting Cu alloys. However, studies on the mechanical properties of and texture evolution in these alloys are few. To determine the relationship between the mechanical and electrical properties of these alloys, their properties and drawing processes were analyzed at room temperature; for this purpose, annealing was performed at 350 °C. The dislocation behavior caused by annealing was investigated by electron backscattered diffraction (EBSD) and X-ray diffraction line profile analysis. EBSD was also used for observing the texture evolution caused by deformation and annealing. An increase in the strain led to the formation of an ideal shear texture, in line with the drawing processes. It is well known that hardness is inversely proportional to electrical conductivity. However, when the hardness of the deformed alloy with a strain of 1.38 was maintained even after annealing for a long time, the electrical conductivity gradually decreased. In other words, as the recrystallized grains were coarsened by reducing the dislocation density, the dislocations were more randomly arranged, resulting in a decrease in the electrical conductivity. Furthermore, a highly strained alloy has more randomly oriented grains, and thus, the evolution of texture changes. The direct relationship between texture evolution and electrical properties could not be determined, but it seems to be a composite effect of dislocation characteristics, texture evolution, and grain size. As noted, the dislocation characteristics and texture evolution affect the mechanical properties.
Published Version
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