Abstract
Abstract: Silver (Ag) thin films are having remarkable characteristics. They have found extensive applications in electronic and optical devices. Silver thin films have potential applications in ultra-high density optical non-volatile memories, transparent electrodes and in fluorescence imaging. Measurements of nonlinear properties are very interesting from the point of the view of optoelectronic and all optical switches. Hence these films are studied in the present work. 1/f noise and nonlinear effects in Silver thin films for different current densities on varying the thickness of the films, at room temperature are studied. The specific dependence of 1/f noise on the thickness of the film, the effect of current densities on 1/f noise for the films of various thicknesses (430A o to 1180A o ) has been investigated. It is noticed that, for a constant current, the thickness of the film leads to an increase of 1/f noise.1/f noise plays an important role in choosing frequency band in which a device can be effectively used. Silver thin films are regarded as a material with many attracting properties such as good conduction, high transmission coefficient etc. It is specially used in optoelectronic devices.
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