Abstract

The effect of the deposition temperature of the buffer layer In2S3 on the band alignment of CZTS/In2S3 heterostructures and the solar cell performance have been investigated. The In2S3 films are prepared by thermal evaporation method at temperatures of 30, 100, 150, and 200 °C, respectively. By using x-ray photoelectron spectroscopy (XPS), the valence band offsets (VBO) are determined to be , , , and eV for the CZTS/In2S3 heterostructures deposited at 30, 100, 150, and 200 °C, respectively, and the corresponding conduction band offsets (CBO) are found to be , , , and eV, respectively. The XPS study also reveals that inter-diffusion of In and Cu occurs at the interface of the heterostructures, which is especially serious at 200 °C leading to large amount of interface defects or the formation of CuInS2 phase at the interface. The CZTS solar cell with the buffer layer In2S3 deposited at 150 °C shows the best performance due to the proper CBO value at the heterostructure interface and the improved crystal quality of In2S3 film induced by the appropriate deposition temperature. The device prepared at 100 °C presents the poorest performance owing to too high a value of CBO. It is demonstrated that the deposition temperature is a crucial parameter to control the quality of the solar cells.

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