Abstract
InSb thin films have been prepared by a one-step electrodeposition technique using sodium tartrate, sodium citrate, and ethylenediamine tetraacetic acid (EDTA) as complexing agents in addition to citric acid. The growth and properties of the InSb thin films were investigated by x-ray diffraction (XRD) analysis, scanning electron microscopy (SEM), energy-dispersive analysis of x-rays (EDAX), and Raman spectroscopy to study the effects of the complexing agents. All samples were annealed in vacuum at 300°C for 1 h prior to characterization. XRD analysis along with Raman spectroscopy revealed that good-quality InSb thin films with zincblende structure were obtained when using sodium citrate and sodium tartrate as complexing agents. EDAX showed that the elemental composition of the films could be controlled by varying the concentrations of complexing agents. Films having the best stoichiometry were obtained when using either 0.2 M sodium citrate or 0.2 M sodium tartrate. Scanning electron microscopy (SEM) showed that the stoichiometric films synthesized using sodium citrate were uniformly covered with submicron-sized particles of spherical shape.
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