Abstract
The electrical properties of a-ZITO TFTs with different channel thicknesses were characterized under proton irradiation with electrical stress. The device measurements showed stronger radiation-tolerance of oxide TFTs with smaller channel thickness.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
