Abstract
The authors investigated the effects of annealing in Ar atmosphere at different temperatures (350–1100 °C) on the densification and leakage current characteristics of thermally oxidized SiO2 films on n-type 4H-SiC. A strong correlation between densification improvement and leakage current reduction was observed. Densification of the SiO2 films, which were characterized by spectroscopic ellipsometry, Fouriertransform infrared spectroscopy and atomic force microscopy, can be significantly improved after annealing at moderate temperature (600 °C). The leakage current is decreased by two orders of magnitude of the SiO2 thin film after annealing at 600 °C. Based on the studies, SiO2 film of the highest quality can be obtained after annealing at 600 °C. Improvements in the quality of the SiO2 thin films after annealing at 600 °C may be explained by the consumption and formation of carbon-related and oxygen-related defects during annealing.
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