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Abstract
Abstract Thin films of Li[Ni0.5Co0.25Mn0.25]O2 were prepared by RF-sputtering technique post-annealed the deposited films at various temperatures in a controlled oxygen atmosphere. The annealing temperature played an important role in the crystallinity of the films. The films post-annealed at optimized temperature displayed an X-ray diffraction peak at 18.29o, which can be ascribed to the Braggs reflection (003) of hexagonal Li[Ni0.5Co0.25Mn0.25]O2. The lattice parameters of the optimized films were a=2.85Å and c=14.45Å with c/a ratio equal to 5.070. The electrochemical activity of the post-annealed films was methodically investigated. The discharge capacity offered by the films is 40μAh/cm2μm at 300°C however this was further improved to 57.5 μAh/cm2.μm by post-annealing at 700°C. Due to structural integrity of Li[Ni0.5Co0.25Mn0.25]O2 film may be used as cathode material for energy storage devices.
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