Abstract
This paper studied the annealing effects on the dielectric characteristics of vanadium doped SrBi 2Ta 2O 9 (SBT). SBT was synthesized at 1000 °C and vanadium doped SBT at 900 °C by solid-state reaction. Crystallization structure and phase purity of the prepared ceramic samples was observed by X-ray diffraction analysis. XRD analysis indicated a single layered perovskite structure without any secondary phases up to 15% of vanadium doping in SBT ceramics. Detailed dielectric study on vanadium doped SBT ceramics indicated that post-sinter annealing enhances the peak dielectric permittivity, which is attributed to the increased homogeneity in the system at atomic scale upon annealing. Annealing for larger time interval suppresses the permittivity growth beyond transition temperature which gives a direct evidence for the existence of lower valance state of vanadium (V +4) in as-sintered SBTV ceramics and also the permittivity growth is related to the oxygen ions or oxygen vacancies created during sintering. UV–Vis spectroscopy was also performed to confirm the lower valance state of the vanadium ions in the ceramics.
Published Version
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