Abstract
We perform a linear morphological stability analysis of a planar interface during unidirectional solidification of a binary alloy for the case of a crystal having an anisotropic thermal conductivity. We calculate a dispersion relation which shows that the onset of instability depends on the orientation of the growth direction with respect to principal crystallographic axes and on the orientation of the wavevector of the perturbation. The onset of instability can be either oscillatory (travelling waves) or non-oscillatory in time. For growth along a principal axis of the crystal there is an exchange of stabilities, and the onset of instability is non-oscillatory. For a uniaxial crystal, we explore the dispersion relation in detail, and give numerical results for the case of an alloy of 0.78 at % bismuth in tin. For low growth velocities the onset of instability is non-oscillatory and occurs for perturbations having a wavevector that lies along a principal crystallographic axis.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.