Editorial

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One of the greatest acknowledgments of one's efforts is when it takes more than one person to cover your workload. This is true when we, with great honor, take over the position as the new Editor-in-Chief and Associate Editor for X-Ray Spectrometry (XRS) after Professor Rene Van Grieken. Professor Van Grieken held the position as Editor-in-Chief for 20 years, and it is his legacy we will try to carefully cherish. At the same time, we will try to further develop the journal for it to continue to evolve with the ever-changing field of x-ray spectrometry. Under the long period of Professor Van Grieken's leadership, XRS has developed into the international journal where the XRF community publish their findings in all aspects of x-ray spectrometry techniques and applications. In the role of Editor-in-Chief Professor Van Grieken has guided, with great care, the Associate Editors responsible for different regions of the world as well as the members of the Editorial board representing a variety of academia and industrial representatives. We will continue working with this highly skilled team and of course with all authors and reviewers working hard to contribute to the high standard of the journal. We are also looking forward to working with the continued support of our publishing manager Samantha Moore from Wiley. We encourage the submission of manuscripts covering new advances in x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources, especially when their content can contribute to the progression of the current best practices. In saying this, we should not forget the important area of applications of x-ray spectrometry. As the technique and the instrumentation develops, we see a growth in applications and we are looking forward to receiving manuscripts covering new applications as well as development of earlier application fields that fall within the scope of the journal. In addition to regular research articles, we encourage authors to submit reviews covering new techniques or applications of x-ray spectrometry. The papers with significant innovation will be published with high priority. With the help of the Associate Editors, Members of the Editorial Board, and the Reviewers, we will continue to develop XRS into an attractive journal for researchers. In closing, we would again like to thank Professor Rene Van Grieken for his successful and caring guiding of XRS over the past 20 years. We have learned a great deal about being an editor from him, and we are truly humbled to have been chosen as his successors.