Edge Location and Identification Method for Electronic Components based on Improved Canny Algorithm

Abstract

The position identification of SMD electronic components mainly uses Canny edge detection algorithm to detect the edges of specific elements, benefited from its computational simplicity. The traditional Canny algorithm lacks the adaptability in gradient calculation and double thresholds selection, which may affect the location and identification accuracy of specific elements in electronic components. In this paper, an improved canny edge detection algorithm is proposed. The gradient magnitude is calculated in four directions, i.e., horizontal, vertical, and diagonal. Both the high and low thresholds can be adaptively determined based on the grayscale distribution information, to increase the adaptability of edge identification. The experimental results show that the proposed method can better locate the true edges of specific elements in electronic components with a reasonable processing speed, compared with the traditional Canny algorithm, and has been successfully applied on practical real-time vision inspection on SMD electronic components.