Abstract
E210 小型筐体内の半導体パッケージ熱性能の把握 : パッケージ基板と筐体底との隙間と熱性能との関係(オーガナイズドセッション21 : 電子機器の熱設計と解析の応用)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.