Abstract
The dynamics of polarization backswitching in highly oriented Pb(Zr0.3Ti0.7)O3 (PZT) thin films has been studied in nanoscale using piezoresponse scanning force microscopy (SFM). Our measurements reveal that a SFM-written domain with diameter about 200 nm in PZT films loses its polarization through both the sidewise and forward backswitching. Both of these sidewise and forward domain wall motions follow a stretched exponential law. However, the characteristic time τ of forward backswitching are about ten times of that sidewise motion. The time dependence of sidewise domain wall velocity indicates that there is a time dependence of activation energy of the barrier that domain motions encounter.
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