Abstract
X-ray diffraction topographs of extremely pure and perfect silicon singlecrystals are made using low-energy undulator radiation from a positron storagering. Typical defect images observed are rather large round images having ablack-white contrast and a diameter of about 40 µm. Applying the dynamicaltheory of x-ray diffraction, the defect contrast is explained by tensile strainin the lattice around voids close to the exit surface. This discovery ofvoid-like microdefects explains, at least in part, the reduced density of thecrystal intended to be used for a redefinition of the unit of mass, thekilogram.
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