Abstract
A method for simulating energy filtered inelastic images in the geometry of reflection high energy electron diffraction (RHEED) is introduced. Inelastic plasmon diffuse scattering (PDS) is treated as an effective position-dependent potential perturbing the electron wavelength in a solid, resulting in an extra phase grating term in the slice transmission function. The energy filtered inelastic images can be calculated following the routine image simulation procedures of transmission electron microscopy (TEM) except using different slice transmission functions for the elastic and inelastic waves, by considering the “transitions” of the elastic scattered electrons to the inelastic scattered electrons. Calculations for GaAs(110) surface show that the electrons with different energy-losses form different RHEED patterns. The build-up processes of the reflected electrons with different energy-losses are described. When the calculated intensity ratios between the reflected electrons without energy-loss and those with energy-loss due to surface plasmon excitations are compared with the measurements of reflection electron energy-loss spectroscopy (REELS), a disparity of less than 20% is obtained for the GaAs(110) surface.
Published Version
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