Abstract
Super-Planckian near-field radiative heat transfer allows effective heat transfer between a hot and a cold body to increase beyond the limits long known for black bodies. Until present, experimental techniques to measure the radiative heat flow relied on steady-state systems. Here, we present a dynamic measurement approach based on the transient plane source technique, which extracts thermal properties from a temperature transient caused by a step input power function. Using this versatile method, that requires only single sided contact, we measure enhanced radiative conduction up to 16 times higher than the blackbody limit on centimeter sized glass samples without any specialized sample preparation or nanofabrication.
Highlights
MethodsTransient plane source (TPS) technique.The basis of our technique is the transient plane source (TPS)method, commonly used in the determination of bulk thermal parameters
In summary we have developed a new, dynamic near-field radiative heat transfer measuring method, the first of its kind for this application
Using gap and reference sample types employing two different glass materials and gaps varying from 7 μm to 150 nm we have experimentally confirmed the ability of the approach to accurately measure near-field thermal radiative heat transfer
Summary
Transient plane source (TPS) technique.The basis of our technique is the transient plane source (TPS)method, commonly used in the determination of bulk thermal parameters. The basis of our technique is the transient plane source (TPS). Method, commonly used in the determination of bulk thermal parameters. In this approach, a thin disk consisting of a nickel double spiral embedded in Kapton[52,53] insulation, acts both as a heat source and temperature sensor. The sensor/heater is brought into contact with the material under investigation, and a step power input function is applied. (Our measurements have been conducted using a commercially available TPS 2500 S from Hot Disk AB, and a Kapton sensor/heater of 19.8 mm diameter provided by this same company). The here presented work is the first extension of the TPS technique to near-field measurements
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