Abstract
This paper deals with a method for the dynamic characterization of scan conversion-based transient digitizers. Such a method is based on the application to the digitized data of a two-dimensional filtering process, implemented by using the Walsh transform. The filtering process avoids incorrect evaluation of the digitizer dynamic performance. In order to test the proposed method, a scan converter model has been also developed. The validity and the application range of the method are illustrated through numerical and experimental results.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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More From: IEEE Transactions on Instrumentation and Measurement
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