Abstract
This paper deals with a method for the dynamic characterization of scan conversion-based transient digitizers. Such a method is based on the application of a two-dimensional filtering process, implemented by using the Walsh transform, on the digitized data of the transient digitizer. The two-dimensional filtering process avoids the incorrect evaluation of the digitizer dynamic performance. Furthermore, a scan converter model to test the proposed method has been developed. To illustrate the validity and the application range of the method preliminary numerical results are reported. >
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