Abstract
In this paper, a dual-band perfect absorber, composed of a periodically patterned elliptical nanodisk graphene structure and a metal ground plane spaced by a thin SiO(2) dielectric layer, is proposed and investigated. Numerical results reveal that the absorption spectrum of the graphene-based structure displays two perfect absorption peaks in the terahertz band, corresponding to the absorption value of 99% at 35μm and 97%at 59μm, respectively. And the resonance frequency of the absorber can be tunned by controlling the Fermi level of graphene layer. Further more, it is insensitive to the polarization and remains very high over a wide angular range of incidence around ±60(0). Compared with the previous graphene dual-band perfect absorption, our absorber only has one shape which can greatly simplify the manufacturing process.
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