Dual-Mode Multiple-Band Digital Controller for High-Frequency DC–DC Converter

Abstract

An integrated digital controller design for dc-dc converter is proposed in this paper. The proposal presents a multiple- band dual-stage (MBDS) delay line A/D converter (ADC) for wide dynamic range of operation with reduced ripple, chip area, and power consumption. This proposal also introduces a novel folding logic for digital error calculation and dual-mode error control PID for improving transient response. A complete closed-loop experimental prototype is demonstrated on a field-programmable-gate- array-based setup. The feasibility and functionality of the proposed digital controller is verified with a closed-loop synchronous buck converter prototype that switches at 1 MHz and regulates over a wide output voltage range of 1.6-3.3 V. The proposed MBDS delay line ADC is fabricated with discrete logic gates and flip-flops. The integrated digital controller is also implemented using standard cell-based design methodology in 0.5-mum CMOS technology. The design reduces 33 % on-chip area compared to an equivalent of 64 tap delay line ADC. The complete digital controller chip takes less than 0.7 mm2 of silicon area and consumes an average current of 92 muA at 1-MHz switching frequency. The voltage-mode digital loop achieves tracking time of less than 10 mus for 1-V step change of the reference voltage and settling time of 20 mus. Post layout simulation and experimental results are demonstrated.