Abstract
Detailed insight into the near-surface area of the ion beam modified polymer is supplied by the measured diffuse reflectivity spectra. The near-surface layer (50÷150 nm) of bulk polymer samples have been implanted with silicon (Si+) and carbon (C+) ions at low energies (E = 30 keV) and a wide range of ion doses (D = 5.1012−2.1017 cm+2). The polymer materials studied were: ultra-high-molecular-weight polyethylene (UHMWPE), poly-propylene (PP), and poly-tetra-fluor-ethylene (PTFE). The diffuse optical reflectivity spectra Rd = f(λ) of the implanted samples have been measured in the visible range (λ = 400÷830 nm). In this paper the dose dependences of the size and sign of the diffuse reflectivity changes ΔRd = f(D) have been analyzed.
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