Abstract
The Doppler broadening of positron annihilation photons detected by a Ge(Li) detector was employed to probe the interactions of positrons in high purity AgCl and AgBr (95%)+AgCl sheet crystals that had been exposed to 1011-1013 ions cm−2 of implanted 12C5+, 14N5+, 16O6+, or 32S6+. The narrowing of the Doppler broadened spectrum varied with the implanted ion, the concentration of the dopant, and the composition of the halide crystals. The decrease in linewidth is attributed to the electronic environment of the defects, and an increased probability of annihilation of near-thermal positrons with conduction electrons relative to annihilation with core electrons.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
