Abstract
In this letter it is shown that both p- and n-type Ge vacuum-deposited films can be obtained on the same GaAs substrate during the same pump-down. p-type films are generally obtained if films are deposited immediately on the substrate at temperature ⩾300 °C, cooled down from outgas temperature 575 °C. n-type films are obtained consistently if the same substrate is then held below 300 °C for about 100 min before deposition. The low electron mobility observed for n-type Ge films leads to the conclusion that the properties of the films are determined by As compensation of p-type defects inherent in the films.
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