Abstract
A detailed dope depth distribution investigation in rapidly solidified (RS) foils of Al alloys has been made using the Rutherford backscattering spectroscopy technique. We found that at the foil surface (0.04–0.06 μm) the dope concentration exceeds the experimental measured concentration. We also found that the Me concentration oscillates through the thickness of the investigated layers. However, in the RS Al–Ge alloy no dope oscillation was detected.
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