Distribution of the magnetic scattering amplitudes in the Fe/Cu multilayer investigated by resonant magnetic diffraction with circularly polarized hard X-rays

Abstract

Resonant X-ray magnetic diffraction profiles were measured for an epitaxial Fe/Cu multilayer using circularly polarized X-rays near the Fe and Cu K-edges. Diffraction intensities were compared with those obtained from the theoretical and empirical models. It is found that the interface Fe moment is reduced to 70% of the inner-layer moment. Concerning the Cu layer, the observed energy dependence of the magnetic diffraction intensities is consistent with that derived from the first-principle band calculation, indicating that magnetic proximity effect in the Cu layer is confined within a few atomic layers near the interface.