Depth-Resolved Induced Magnetic Polarization in the Cu layer of the Gd/Cu Multilayer Investigated by Resonant X-ray Magnetic Diffraction at the CuKAbsorption Edge

Abstract

Depth-resolved induced magnetic polarization in the Cu layer of the [Gd (57.4 A)/Cu (16.5 A)] multilayer is determined by resonant X-ray magnetic diffraction technique. The X-ray energy was tuned near the Cu K absorption edge (8981 eV). The resonant magnetic diffraction peaks from second to fourth order were measured at 10 and 75 K by helicity switching combined with field reversal. The analysis indicates that the induced magnetic polarization extends to the center of the Cu layer and that the magnetization polarization distribution scaled to the Gd magnetization is unchanged against temperature. The shape of the magnetic polarization distribution in the Gd/Cu multilayer is different from that predicted theoretically in the Co/Cu multilayer, where the induced magnetic polarization is concentrated mainly at the interface. A possible reason for the different distribution of the magnetic polarization in the Gd/Cu and Co/Cu systems is discussed.