Abstract
We present a BIST-based approach able to detect and accurately diagnose any single and most multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs). For any faulty PLB, we also identify its internal faulty modules or modes of operation. This accurate diagnosis provides the basis for both failure analysis used for yield improvement and for any repair strategy used for fault-tolerance. We present experimental results showing detection and identification of faulty PLBs in actual defective FPGAs.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
