Abstract

Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance. In this paper we present the first approach able to diagnose faulty programmable logic blocks (PLBs) in Field Programmable Gate Arrays (FPGAs) with maximal diagnostic resolution. Our approach is based on a new Built-In Self-Test (BIST) architecture for FPGAs and can accurately locate any single and most multiple faulty PLBs. An adaptive diagnostic strategy provides identification of faulty PLBs with a 7% increase in testing time over the complete detection test, and can also be used for manufacturing yield enhancement. We present results showing identification of faulty PLBs in defective ORCA chips.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.