Abstract
The microstructure of two heteroepitaxial YBa 2Cu 3O 7− x /SrTiO 3 (YBCO/STO) multilayers on (110) rhombohedral LaAlO 3 substrates has been characterised using high resolution transmission electron microscopy (HREM). The samples differed in the YBCO layer thicknesses, while the STO layer thicknesses were constant. The YBCO/STO interfaces were smooth and sharp. The individual layer thicknesses were relatively uniform, but the STO layers were occasionally discontinuous, indicating a three-dimensional growth mode. The STO (001) planes were tilted a small angle, when they followed irregularities in the YBCO layer surfaces. This did not affect the growth of the subsequent YBCO layers. Energy dispersive X-ray analysis revealed a Sr/Ti-ratio between 0.65–0.70 for the STO layers. The lattice mismatch between the YBCO and the STO resulted in strained layers for both samples. Y 2O 3 precipitates nucleated both on YBCO and STO. STO was not observed to nucleate on the Y 2O 3, which created pinholes and destroyed the periodicity of the subsequent layers.
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