Abstract
Dislocations in evaporated single crystal tin films have been investigated by means of the electron microscope. The operation of the following slip systems was directly observed: (121) [1̄01], (101̄) [101], (100) [011], (1̄10) [111] and (001) [ hkl]. (001) slip has not been reported previously and may occur only in thin films. (110) [001] and (100) [001] slip were not observed, possibly because of unfavorable diffraction conditions in the [001] oriented films. Most of the dislocations had screw character. The following cases of screw dislocation cross-slip between different slip systems were observed: (100) [011] ↔ (01̄1) [011], (100) [011] ↔ (21̄1) [011] and (01̄1) [011] ↔ (21̄1) [011]. Cross-slip between non-parallel planes of the same slip system was observed in only one case: (12̄1) [1̄01] ↔ (121) [1̄01]. A consideration of the available qualitative evidence suggests that the stacking fault energy in tin is relatively high.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call