Abstract
Dislocation multiplication and exhaustion processes in germanium arerevisited in the light of new data from mechanical test transients. They aredocumented by transmission electron microscope (TEM) observations anddislocation velocity measurements by the etch pit technique. The transient testsconsist of stress relaxations, creep tests and stress dip tests performedalong the monotonic curve. The relaxation and creep curves exhibit anon-logarithmic dependence on time, unlike in other classes of materials.Dislocation multiplication is evidenced by these transient curves before the upperyield point. In addition, after the lower yield point, dislocation exhaustion takesplace at the end of the transient. Some evidence of strain localization isalso provided by strain dip tests and transmission electron micrographs.
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