Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

Abstract

Our work placed within the framework analysis of the microstructure evolutions of the crystalline materials related to the linear defects (dislocations), in order to determine the associated stored (potential) elastic energy [1]. The aim is to identify the final dislocation configurations (density and arrangement) obtained after deformation. A new approach, based on micromechanical development introducing Green's function tensor and dislocation density tensor, was developed. Calculation of the elastic distortion tensor for an edge dislocation was deduced by analytical and numerical integration methods. By projection over the diffracting volumes, the variation of the Fourier coefficients versus the harmonic Fourier parameter is also determined for various diffracting planes. It is also shown that, as the dislocation crystallography is included in our approach, it is not necessary to use a contrast factor.