Dislocation Density Evolution During Creep of AZ31 Mg Alloy: A Study by X-ray Diffraction Line Profile Analysis

Abstract

X-ray diffraction line profile analysis technique was employed to investigate the dislocation density evolution during high temperature creep of Mg-3Al-1Zn alloy. The microstrains within the domain and dislocation density were calculated by the simplified Williamson–Hall and Williamson–Smallman methods. Further analysis on the possible dynamic recrystallization (DRX) and dynamic recovery (DRV) shows a relation between the number of dynamically recrystallized grains and the dislocation density. At constant temperature, higher stresses lead to more DRX and an enhancement on the dislocation density; whereas, at lower stresses the DRV is dominant leading to decrease in the dislocation density.