Abstract
Recent transmission electron microscopy (TEM) experiments have shown that the transformation of the Bi cuprate 2212 phase to 2223 phase consists of random intercalation and fast growth of Ca/CuO 2 planes in the Bi-2212 matrix. This contridicts with the prediction of the conventional nucleation and growth theory. A model is proposed which considers the cylindrical void created by the edge dislocation due to the insertion of a Ca/CuO 2 plane to be a channel for fast ion diffusion. A layer-rigidity model is used to estimate the size of the void for Bi-2212/Bi-2223. The calculated void size for Bi-2212/Bi-2223 compounds is consistent with the existence of fast ion diffusion along the ab-plane. The experimentally observed time dependence of the volume fraction of Bi-2223 during the transformation is found to be consistent with a one-dimensional diffusion-controlled transformation mechanism, as predicted by our model.
Published Version
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