Abstract
The spontaneous surface luminescence properties of InGaN/GaN quantum structure lattice (QSL) are reported. The QSL consists of a two-dimensional array of InGaN/GaN quantum boxes (QBs) arranged in a rectangular pattern of 200 nm periodicity. The measured angular dependent photoluminescence (PL) spectra show a strong dependence on the in-plane Bragg diffractions between QBs. The maximum PL intensity of the InGaN/GaN QSL array that fulfill the Bragg condition points in the normal direction of the sample surface with a narrow radiation angle of ∼ ±12°. In addition, a small side lobe is also shown at ±40°. For the QSL sample that does not fulfill the Bragg diffraction condition, the radiation pattern shows a conventional cosine distribution. The finite-difference time-domain numerical analysis confirms that the lowest order and higher order Bragg diffractions between QBs determine the main and the small side lobe of the radiation pattern measured in QSLs, respectively.
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