Direct sampling time-of-flight mass spectrometers for technological analysis

Abstract

The practicability of direct sampling time-of-flight mass spectrometers for routine technological analysis is considered. The discussed set incorporates two TOF instruments together covering analysis of solid, liquid, and gas samples without the need for time consuming sample preparation. Both an electron ionization reflectron TOF mass analyzer designed for the analysis of gas and liquid samples and a laser ionization axial electrostatic TOF mass analyzer designed for analysis of solid and powder samples use a single system for data acquisition, collection and processing. These instruments achieve ng/g range sensitivity and mass resolution exceeding 1000. Because of its compact design the system also can be realized as a mobile laboratory for on-site analysis. Prospects for applying the instruments to different technological applications are discussed.