Abstract
X-ray magnetic circular dichroism (XMCD) was used to directly probe the depth-dependent magnetization reversal of CoPtCr-SiO2-based exchange-coupled-composite media with laminated soft layers. A thin Fe-marker layer in the soft layer was used as the indicator of local magnetization. Element-specific XMCD loops of Fe-marker layers confirmed the transition of the magnetization reversal from rigid magnets to exchange-spring magnets with increasing thickness of the soft layer. The micromagnetic simulations revealed the importance of the reduced exchange constant (Asoft) by laminating the soft layer for domain-wall assisting reversal. By comparing XMCD loops with simulations, we can deduce the effective Asoft.
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