Abstract
The atomic arrangement of the Si(110)-(16×2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K. The pentagonal structure, which is the most important building block of the reconstruction, was concluded to consist of five atoms, while only four or five spots (depending on tip bias) have been reported with scanning tunneling microscopy (STM). Single atoms were determined to exist near step edges between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure.
Highlights
The Si(110) surface, which is one of the low-index Si planes, has been attracting growing interest in the fields of industrial technology and surface science
We present key evidence to confirm the reconstruction model in which each pentagon consists of five atoms and single atoms exist around step edges, which has not been reported using scanning tunneling microscopy (STM)
In this atomic force microscopy (AFM) image, zigzag chains extending in the direction were dominant
Summary
The Si(110) surface, which is one of the low-index Si planes, has been attracting growing interest in the fields of industrial technology and surface science. The Si(110)-(16×2) reconstructed surface is considered to be an ideal 1D template [4,7,9]. Since this reconstructed surface is reported to be two dimensionally chiral, it has been the subject of many investigations, for example, in efforts to control the chirality for reliable production of nanowires and other nanostructures [7,10,11,12,13]. By annealing below 700 °C [14], the Si(110)-(16×2) reconstruction is formed over large areas on the Si(110) surface
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