Non-contact AFM

Abstract

This special issue is focussed on high resolution non-contact atomic forcemicroscopy (AFM). Non-contact atomic force microscopy was establishedapproximately 15 years ago as a tool to image conducting and insulating surfaceswith atomic resolution. Since 1998, an annual international conference has takenplace, and although the proceedings of these conferences are a useful source ofinformation, several key developments warrant devoting a special issue to thissubject.In the theoretic field, the possibility of supplementing established techniquessuch as scanning tunneling microscopy (STM) and Kelvin probe microscopy withatomically resolved force micrsoscopy poses many challenges in the calculationof contrast and contrast reversal.The surface science of insulators, self-assembled monolayers and adsorbateson insulators is a fruitful field for the application of non-contact AFM: severalarticles in this issue are devoted to these subjects. Atomic imaging andmanipulation have been pioneered using STM, but because AFM allows themeasurement of forces, AFM has had a profound impact in this field as well.Three-dimensional force spectroscopy has allowed many important insights intosurface science. In this issue a combined 3D tunneling and force microscopy isintroduced.Non-contact AFM typically uses frequency modulation to measure forcegradients and was initially used mainly in a vacuum. As can be seen in this issue,frequency modulation is now also used in ambient conditions, allowing betterspatial and force resolution.We thank all of the contributors for their time and efforts in making thisspecial issue possible. We are also very grateful to the staff of IOP Publishing forhandling the administrative aspects and for steering the refereeing process.Non-contact AFM contentsRelation between the chemical force and the tunnelling current in atomic point contacts: a simple model Pavel Jelínek, Martin Ondrácek and Fernando FloresTheoretical simulation of Kelvin probe force microscopy for Si surfaces by taking account of chemical forces Masaru Tsukada, Akira Masago and Mamoru ShimizuReversal of atomic contrast in scanning probe microscopy on (111) metal surfaces M Ondrácek, C González and P JelínekMechanical properties of H2Pc self-assembled monolayers at the single molecule level by noncontact atomic force microscopy Han-Qing Mao, Na Li, Xi Chen and Qi-Kun XueHigh-resolution imaging of C60 molecules using tuning-fork-based non-contact atomic force microscopy R Pawlak, S Kawai, S Fremy, T Glatzel and E MeyerNC-AFM contrast formation on the calcite (101¯4) surface Philipp Rahe, Jens Schütte and Angelika KühnleImaging and manipulation of adatoms on an alumina surface by noncontact atomic force microscopy G H Simon, M Heyde and H-J FreundThree-dimensional scanning force/tunneling spectroscopy at room temperature Yoshiaki Sugimoto, Keiichi Ueda, Masayuki Abe and Seizo MoritaImaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias A Sweetman, R Danza, S Gangopadhyay and P MoriartyManipulation of individual water molecules on CeO2(111) S Torbrügge, O Custance, S Morita and M ReichlingFM-AFM imaging of a commercial polyethylene film immersed in n-dodecane Takumi Hiasa, Tomoki Sugihara, Kenjiro Kimura and Hiroshi Onishi