Abstract
We employ internal photoemission spectroscopy to directly measure the valence-band Van Hove singularity, and identify phonons participating in indirect intervalence-band optical transitions. Photoemission of holes photoexcited through transitions between valence bands displays a clear and resolvable threshold, unlike previous reports of interband critical points which become obscure in doped materials. We also demonstrate the enhancement of optical phonon-assisted features primarily contributing to the photoemission yield. This result is evidence of the relaxation of photoexcited hot holes through intravalence-band scatterings in heterojunctions, which contrast with intervalence-band scatterings in bulks.
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