Abstract
Journal Article Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography Get access David Cooper, David Cooper Univ. Grenoble Alpes, F-38000 Grenoble, FranceCEA, LETI, Minatec Campus, F-38054 Grenoble, France Search for other works by this author on: Oxford Academic Google Scholar Nicolas Bernier, Nicolas Bernier Univ. Grenoble Alpes, F-38000 Grenoble, FranceCEA, LETI, Minatec Campus, F-38054 Grenoble, France Search for other works by this author on: Oxford Academic Google Scholar Christoph Baumer, Christoph Baumer Peter Grunberg Institute, FZ Julich, D-52425 Julich, Germany Search for other works by this author on: Oxford Academic Google Scholar Rafal Dunin-Borkowski, Rafal Dunin-Borkowski Peter Grunberg Institute, FZ Julich, D-52425 Julich, Germany Search for other works by this author on: Oxford Academic Google Scholar Regina Dittmann Regina Dittmann Peter Grunberg Institute, FZ Julich, D-52425 Julich, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S5, 1 November 2016, Pages 52–53, https://doi.org/10.1017/S1431927616012289 Published: 21 December 2016
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