Abstract
We have established a high-precision depth-resolved x-ray magnetic circular dichroism (XMCD) technique, in which the probing depth of the partial electron yield XMCD spectra is controlled by changing the detection angle of the emitted electrons. The data quality has been significantly improved by using an imaging-type microchannel plate detector. We applied this new technique to Fe ultrathin films grown on Cu(100), and directly confirmed that the surface two layers of the 7 ML Fe film are ferromagnetically coupled, while the inner layers are in the spin density wave (SDW) state at 130 K. Then we separately extracted the XMCD spectra for the surface ferromagnetic (FM) and inner SDW layers. It was indicated that the SDW magnitude is almost the same as the magnetic moment of the surface FM layers, and that the orbital moment of the surface layers is larger than that of the SDW ones. Moreover, the extracted spectrum for the SDW layers exhibited a bulk-like feature, while the surface spectrum was similar to that from the 2 ML film, in which no bulk component should be included.
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